Analytical Sampling Techniques - メーカー・企業と業務用製品 | イプロスものづくり

Sampling techniques for the analysis of microscopic foreign substances

We will report rapid analysis results using various sampling techniques regarding foreign substances that significantly impact the yield of electronics products.

■Special Sampling Techniques for Foreign Substances in Multilayer Films - Foreign substances buried in metal films on substrates Metal film etching ⇒ Transfer to Si wafer ⇒ FT-IR analysis - Foreign substances in multilayer films Cutting off the surface layer ⇒ Transfer to Si wafer ⇒ FT-IR analysis Microtome/FIB thinning ⇒ Transfer to Si wafer ⇒ FT-IR analysis